PREDICTION OF ELECTRONIC UNIT RADIATED EMISSIONS FROM BOTH PCB NEAR FIELD AND SHIELDING ENCLOSURE CHARACTERIZATION
This paper presents the post-processing methodology devoted to the Near-Field-Scanning (NFS) to provide assistance in ElectroMagnetic Compatibility (EMC) design phases of complex electronics products.
A major challenge for spacecraft manufacturers for incoming year concerns the control of units Radiated Emissions (RE). Indeed, high speed links could induce RE non-compliance for units in on-board receiver frequencies (ex: GPS, TCR…). To avoid additional test campaign or system level analyses, Near Field techniques could be a powerful way to anticipate RE non-conformities in unit design phase.
Based both on NFS (only Hx and Hy magnetic components very closed to the Printed Circuit Board (PCB)), and on Shielding enclosure Effectiveness (SE) characterization, the proposed “NFS2RE” (Near Field Scanning to Radiated Emission Test) methodology allows:
1) RE-Test prediction of PCB in free space condition from only Hx and Hy NFS
2) Prediction of Shielding PCB’s enclosure attenuation on RE-Test from SE characterization
Auteurs : S.Leman, R.Omarouayache, F.Hoëppe, A.Piche
2019 ESA Workshop on Aerospace EMC, Budapest